Concepedia

Electrical switching and noise spectrum of Si-SiO2 interface defects generated by hot electrons

M. Bollu, F. Koch, A. J. Madenach, J. Scholz

Applied Surface Science · 1987 · 18 citations · 3 references

DOI

Concepts

References

3

1/<i>f</i> and random telegraph noise in silicon metal-oxide-semiconductor field-effect transistors

Michael J. Uren, D. J. Day, M. J. Kirton · Applied Physics Letters · 1985 · 312 citations

, , +15

Capture and emission kinetics of individual Si:SiO2 interface states

M. J. Kirton, Michael J. Uren · Applied Physics Letters · 1986 · 148 citations

, , +16

Flicker noise in hot electron degraded short channel MOSFETs

M. Stegherr · Solid-State Electronics · 1984 · 27 citations

, , +16