B. I. Boyanov

Tri-Gate fully-depleted CMOS transistors: fabrication, design and layout

Barry M. Doyle, B. I. Boyanov, Suman Datta et al. · 2004 · 219 citations

Device Modeling, Electrical Engineering, Physical Design (Electronics) +11

Re-investigation of titanium silicalite by X-ray absorption spectroscopy: Are the novel titanium sites real?

Shiyou Pei, G. Zając, James A. Kaduk et al. · Catalysis Letters · 1993 · 94 citations

Materials Science, X-ray Crystallography, Materials Engineering +13

X-ray photoelectron spectroscopy measurement of the Schottky barrier at the SiC(N)/Cu interface

Sean W. King, Marc French, Milt Jaehnig et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2011 · 50 citations

Materials Science, Electrical Engineering, Semiconductor Device +13

Estimation of measurement uncertainties in XAFS data

M. Newville, B. I. Boyanov, D. E. Sayers · Journal of Synchrotron Radiation · 1999 · 49 citations · Full text

Silicon nano-transistors for logic applications

R. Chau, B. I. Boyanov, B.S. Doyle et al. · Physica E Low-dimensional Systems and Nanostructures · 2003 · 49 citations

Electrical Engineering, Engineering, Nanoelectronics +5