Jeffery C. C. Lo

Design, Materials, Process, Fabrication, and Reliability of Fan-Out Wafer-Level Packaging

John H. Lau, Ming Li, Qingqian Margie Li et al. · IEEE Transactions on Components Packaging and Manufacturing Technology · 2018 · 93 citations

Engineering, Electrical Engineering, Materials Science +15

Fan-Out Wafer-Level Packaging for Heterogeneous Integration

John H. Lau, Ming Li, Margie Li Qingqian et al. · IEEE Transactions on Components Packaging and Manufacturing Technology · 2018 · 85 citations

Engineering, Computer Engineering, Manufacturing Processes +13

Microhardness and microstructure of ion-beam-sputtered, nitrogen-doped NiFe films

Tong Wu, C. Hwang, Jeffery C. C. Lo et al. · Thin Solid Films · 1988 · 50 citations

Natural Sciences, Materials Engineering, Materials Science +10

Chip-First Fan-Out Panel-Level Packaging for Heterogeneous Integration

Cheng-Ta Ko, John H. Lau, Ming Li et al. · IEEE Transactions on Components Packaging and Manufacturing Technology · 2018 · 48 citations

Engineering, Electrical Engineering, Materials Engineering +17

Fan-Out Wafer-Level Packaging (FOWLP) of Large Chip with Multiple Redistribution Layers (RDLs)

John H. Lau, Ming Li, Nelson Fan et al. · Journal of Microelectronics and Electronic Packaging · 2017 · 40 citations

Engineering, Materials Engineering, Materials Science +15