C. M. Liu

On-Resistance Degradation Induced by Hot-Carrier Injection in LDMOS Transistors With STI in the Drift Region

Jone F. Chen, Kuen-Shiuan Tian, Shiang-Yu Chen et al. · IEEE Electron Device Letters · 2008 · 84 citations

Engineering, Electrical Engineering, Microelectronics +16

A highly scaled, high performance 45 nm bulk logic CMOS technology with 0.242 μm<sup>2</sup> SRAM cell

Kuan‐Lun Cheng, Chung-Cheng Wu, Y.P. Wang et al. · 2007 · 37 citations

Engineering, Computer Engineering, Electrical Engineering +16

Effect of Drift-Region Concentration on Hot-Carrier-Induced $R_{\rm on}$ Degradation in nLDMOS Transistors

Jone F. Chen, J. R. Lee, Kuo-Ming Wu et al. · IEEE Electron Device Letters · 2008 · 28 citations

Engineering, Electrical Engineering, Materials Science +15

off-State Avalanche-Breakdown-Induced on-Resistance Degradation in Lateral DMOS Transistors

Jone F. Chen, J. R. Lee, Kuo-Ming Wu et al. · IEEE Electron Device Letters · 2007 · 21 citations

Engineering, Electrical Engineering, Materials Science +17

Investigation on the Initial Hot-Carrier Injection in P-LDMOS Transistors With Shallow Trench Isolation Structure

Ru-Yi Su, Ping-Chuan Chiang, Jeng Gong et al. · IEEE Transactions on Electron Devices · 2008 · 12 citations

Engineering, Electrical Engineering, Microelectronics +15