P. Flaitz

Imaging of Arsenic Cottrell Atmospheres Around Silicon Defects by Three-Dimensional Atom Probe Tomography

Keith Thompson, P. Flaitz, Paul Ronsheim et al. · Science · 2007 · 186 citations

Engineering, Microscopy, Silicon On Insulator +20

Novel Lithography-Independent Pore Phase Change Memory

M. Breitwisch, T. Nirschl, C.F. Chen et al. · 2007 · 109 citations

Materials Science, Pore Diameter, Electrical Engineering +14

Penetration of Polycrystalline Alumina by Glass at High Temperatures

P. Flaitz, Joseph A. Pask · Journal of the American Ceramic Society · 1987 · 97 citations

Engineering, Glass-forming Liquid, Glass Material +17

Impact of Cu microstructure on electromigration reliability

Chao Hu, L. Gignac, B. G. Baker et al. · 2007 · 63 citations

Materials Engineering, Materials Science, Electrical Engineering +14

Property modifications of nanoporous pSiCOH dielectrics to enhance resistance to plasma-induced damage

E. Todd Ryan, S. M. Gates, A. Grill et al. · Journal of Applied Physics · 2008 · 53 citations

Materials Science, Dielectric Films, Engineering +15