Takashi Aikyo

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects

Xijiang Lin, Kun-Han Tsai, Chen Wang et al. · Proceedings - Asian Test Symposium/Proceedings · 2006 · 132 citations

Engineering, New Atpg Methodology, Mem Testing +16

A Capture-Safe Test Generation Scheme for At-Speed Scan Testing

Xiaoqing Wen, Kohei Miyase, Seiji Kajihara et al. · 2008 · 32 citations

Engineering, Capture Ir-drop, Mem Testing +18

Diagnostic test generation for transition faults using a stuck-at ATPG tool

Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno et al. · 2009 · 30 citations

Engineering, Verification, Diagnosis +20

Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-Identification

Kohei Miyase, K. Noda, Hideaki Ito et al. · 2008 · 24 citations

A Variability-Aware Adaptive Test Flow for Test Quality Improvement

Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2014 · 22 citations

Engineering, Mem Testing, Computer Architecture +19