Yoshinobu Higami

Reduced scan shift: a new testing method for sequential circuits

Yoshinobu Higami, Seiji Kajihara, K. Kinoshita · 2002 · 36 citations

Hardware Security, Scan Shift Operations, Engineering +15

Diagnostic test generation for transition faults using a stuck-at ATPG tool

Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno et al. · 2009 · 30 citations

Engineering, Verification, Diagnosis +20

Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation

Senling Wang, Hanan T. Al-Awadhi, Hamada Soh et al. · 2016 · 24 citations

Fault Diagnosis, Engineering, Structure-based Methods +21

Clues for Modeling and Diagnosing Open Faults with Considering Adjacent Lines

Hiroshi Takahashi, Yoshinobu Higami, Shuhei Kadoyama et al. · 2007 · 15 citations

Engineering, Mem Testing, Considering Adjacent Lines +17

Timing-Aware Diagnosis for Small Delay Defects

Takashi Aikyo, Hiroshi Takahashi, Yoshinobu Higami et al. · 2007 · 14 citations

Fault Diagnosis, Engineering, Measurement +16