Alessio Griffoni

Radiation Effects in Advanced Multiple Gate and Silicon-on-Insulator Transistors

Eddy Simoen, Marc Gaillardin, Philippe Paillet et al. · IEEE Transactions on Nuclear Science · 2013 · 149 citations

Engineering, Computer Engineering, Electrical Engineering +17

Laser- and Heavy Ion-Induced Charge Collection in Bulk FinFETs

Farah El-Mamouni, En Xia Zhang, N. D. Pate et al. · IEEE Transactions on Nuclear Science · 2011 · 73 citations

Engineering, Electrical Engineering, Electronic Materials +12

Neutron-Induced Failure in Silicon IGBTs, Silicon Super-Junction and SiC MOSFETs

Alessio Griffoni, Jeroen van Duivenbode, Dimitri Linten et al. · IEEE Transactions on Nuclear Science · 2012 · 51 citations

Engineering, Electrical Engineering, Materials Science +16

Neutron-Induced Soft Errors in Graphic Processing Units

Paolo Rech, C. Aguiar, Ronaldo Rodrigues Ferreira et al. · 2012 · 27 citations

Engineering, Computer Engineering, Computer Science +17

Next generation bulk FinFET devices and their benefits for ESD robustness

Alessio Griffoni, S. Thijs, C. Russ et al. · 2009 · 26 citations

Engineering, Electrical Engineering, Electronic Materials +10