Farah El-Mamouni

Radiation Effects in Advanced Multiple Gate and Silicon-on-Insulator Transistors

Eddy Simoen, Marc Gaillardin, Philippe Paillet et al. · IEEE Transactions on Nuclear Science · 2013 · 143 citations

Electrical Engineering, Planar Devices, Engineering +12

Laser- and Heavy Ion-Induced Charge Collection in Bulk FinFETs

Farah El-Mamouni, En Xia Zhang, N. D. Pate et al. · IEEE Transactions on Nuclear Science · 2011 · 70 citations

Photonics, Electrical Engineering, Advanced Bulk Finfets +11

Heavy-Ion-Induced Current Transients in Bulk and SOI FinFETs

Farah El-Mamouni, En Xia Zhang, Dennis R. Ball et al. · IEEE Transactions on Nuclear Science · 2012 · 48 citations

Device Modeling, Electrical Engineering, Engineering +12

Modeling of Ionizing Radiation-Induced Degradation in Multiple Gate Field Effect Transistors

Ivan Sanchez Esqueda, Hugh Barnaby, Keith E. Holbert et al. · IEEE Transactions on Nuclear Science · 2011 · 41 citations

Engineering, Semiconductor Device, Circuit Simulators +17

Total Ionizing Dose Effects on FinFET-Based Capacitor-Less 1T-DRAMs

En Xia Zhang, Daniel M. Fleetwood, Farah El-Mamouni et al. · IEEE Transactions on Nuclear Science · 2010 · 28 citations

Device Modeling, Electrical Engineering, Finfet-based Capacitor-less 1T-drams +15