E. Langer

Through Silicon Via Reliability

Cathal Cassidy, Jochen Kraft, S. Carniello et al. · IEEE Transactions on Device and Materials Reliability · 2012 · 57 citations

Engineering, Electrical Engineering, Manufacturing Engineering +17

Two-dimensional modeling of ion implantation with spatial moments

G. Hobler, E. Langer, S. Selberherr · Solid-State Electronics · 1987 · 36 citations

Engineering, Biomedical Engineering, Medical Physics +6

Comparison of Modeling Approaches for the Capacitance–Voltage and Current–Voltage Characteristics of Advanced Gate Stacks

Pierpaolo Palestri, N. Barin, Dominique Brunel et al. · IEEE Transactions on Electron Devices · 2007 · 29 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Accurate determination of material constants of piezoelectric crystal from SAW velocity measurements

G. Kovacs, G. Trattnig, E. Langer · 2003 · 23 citations

Natural Sciences, Materials Engineering, Materials Science +16

Taking SOI substrates and low-k dielectrics into high-volume microprocessor production

D. Greenlaw, G. Burbach, Thomas Feudel et al. · 2004 · 19 citations

Engineering, Computer Engineering, Electrical Engineering +17