D. Greenlaw

Stressed Out: Macroprudential Principles for Stress Testing

D. Greenlaw, Anil Kashyap, Kermit L. Schoenholtz et al. · SSRN Electronic Journal · 2012 · 83 citations · Full text

Integration and optimization of embedded-sige, compressive and tensile stressed liner films, and stress memorization in advanced SOI CMOS technologies

L.T. Su, John Pellerin, Shih-Fen Huang et al. · 2005 · 63 citations

Engineering, Vlsi Design, Silicon On Insulator +16

Multiple Stress Memorization In Advanced SOI CMOS Technologies

A. Wei, Maciej Wiatr, A. Mowry et al. · 2007 · 38 citations

Engineering, Vlsi Design, Computer Architecture +16

Language after liftoff: Fed communication away from the zero lower bound

Michael Feroli, D. Greenlaw, Peter Hooper et al. · Research in Economics · 2017 · 38 citations

Language Policy, Sociolinguistics, Language Symbiosis +5

Taking SOI substrates and low-k dielectrics into high-volume microprocessor production

D. Greenlaw, G. Burbach, Thomas Feudel et al. · 2004 · 19 citations

Engineering, Vlsi Design, Industrial Engineering +16