P. Hopper - Concepedia

Author

P. Hopper

Texas Instruments (United States)

Also Known As

P. Hopper, P. J. Hopper, P.J. Hopper, Peter Hopper, Peter J. Hopper

Publications

515

Citations

H-Index

Concepts

All Affiliations

Texas Instruments (United States)KU Leuven IMEC

About

P. Hopper is an author at Texas Instruments (United States) specializing in electrical engineering, engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	20	376
2	Electrical Engineering	13	19	363
3	Computer Engineering	10	10	206
4	Education	2	2	27
5	Applied Physics	2	2	38

P. Hopper

Publications

397

Citations

H-Index

Page 1

	Year	Citations
High Holding Voltage Cascoded LVTSCR Structures for 5.5-V Tolerant ESD Protection Clamps A. Concannon, M. terBeek, P. Hopper IEEE Transactions on Device and Materials Reliability Low-power ElectronicsElectrical EngineeringEngineeringVlsi DesignCircuit System	2004	60
Comparison of ESD protection capability of lateral BJT, SCR and bidirectional. SCR for hi-voltage BiCMOS circuits A. Concannon, M. ter Beek, P. Hopper Electrical EngineeringEngineeringHigh Voltage EngineeringHi-voltage Bicmos CircuitsEsd Protection Capability	2003	35
A complementary bipolar technology family with a Vertically Integrated PNP for high-frequency analog applications Rashid Bashir, F. Hébert, J. DeSantis, IEEE Transactions on Electron Devices Vertically Integrated PnpElectrical EngineeringPolycrystalline Silicon EmittersEngineeringVlsi Design	2001	31
ESD protection of double-diffusion devices in submicron CMOS processes A. Concannon, P. Hopper, M. ter Beek Electrical EngineeringEngineeringDouble Diffusion 12Advanced Packaging (Semiconductors)Nanoelectronics	2004	23
A dual-base triggered SCR with very low leakage current and adjustable trigger voltage James Di Sarro, В.А. Ващенко, Elyse Rosenbaum, Electrical Overstress/Electrostatic Discharge Symposium Trigger VoltageComputer EngineeringNew Dual-baseAdjustable Trigger VoltageLow Leakage	2008	21
Bipolar SCR ESD devices P. Hopper Microelectronics Reliability Electrical EngineeringEngineeringAdvanced Packaging (Semiconductors)Active DeviceElectronic Packaging	2005	21
Implementation of dual-direction SCR devices in analog CMOS process Victor P. Kuznetsov, P. Hopper Electrical EngineeringEngineeringVlsi DesignPositive Feedback MechanismCircuit System	2007	18
Improving the ESD self-protection capability of integrated power NLDMOS arrays В.А. Ващенко, A. Strachan, D. Linten, Electrical EngineeringEngineeringElectronic EngineeringIntegrated Power ArraysBias Temperature Instability	2010	17
Implementation of 60V tolerant dual direction ESD protection in 5V BiCMOS process for automotive application W.J. Kindt, M. ter Beek, P. Hopper Electrical EngineeringEngineeringVlsi DesignThin Film ResistorsV Bicmos Process	2004	16
Active Control of the Triggering Characteristics of NPN BJT, BSCR and NLDMOS-SCR Devices D. Farrenkopf, P. Hopper Electrical EngineeringEsd ProtectionEngineeringHigh Voltage EngineeringElectronic Engineering	2007	15

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