В.А. Ващенко

A dual-base triggered SCR with very low leakage current and adjustable trigger voltage

James Di Sarro, В.А. Ващенко, Elyse Rosenbaum et al. · Electrical Overstress/Electrostatic Discharge Symposium · 2008 · 21 citations

Engineering, Electrical Engineering, Microelectronics +5

Turn-off characteristics of the CMOS snapback ESD protection devices - new insights and its implications

В.А. Ващенко, Mirko Scholz, Ph. Jansen et al. · 2006 · 17 citations

Engineering, Electrical Engineering, Circuit Theory +7

Improving the ESD self-protection capability of integrated power NLDMOS arrays

В.А. Ващенко, A. Strachan, D. Linten et al. · 2010 · 17 citations

Engineering, Electrical Engineering, Electronic Materials +9

On-wafer human metal model measurements for system-level ESD analysis

Mirko Scholz, D. Linten, S. Thijs et al. · VUBIR (Vrije Universiteit Brussel) · 2009 · 14 citations

Engineering, Electrical Engineering, Instrumentation +16

Extreme voltage and current overshoots in HV snapback devices during HBM ESD stress

D. Linten, В.А. Ващенко, Mirko Scholz et al. · 2008 · 14 citations

Engineering, Electrical Engineering, Physics +11