Nanometer-resolution white-light scanning interferometry for surface-profiling of hybrid bonding samples for advanced semiconductor packaging

Numerical solution of initial boundary value problems involving maxwell's equations in isotropic media

K.S. Yee · IEEE Transactions on Antennas and Propagation · 1966 · 14.7K citations

Natural Sciences, Electrical Engineering, Physics +15

Atomic Force Microscope

G. Binnig, C. F. Quate, Ch. Gerber · Physical Review Letters · 1986 · 14.4K citations · Full text

Natural Sciences, Materials Science, Physics +14

Refractiveindex.info database of optical constants

Mikhail Polyanskiy · Scientific Data · 2024 · 612 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Efficient nonlinear algorithm for envelope detection in white light interferometry

Kieran G. Larkin · Journal of the Optical Society of America A · 1996 · 407 citations

Natural Sciences, Physics, Computer Vision +14

Surface Profiling by Analysis of White-light Interferograms in the Spatial Frequency Domain

Peter J. de Groot, L. Deck · Journal of Modern Optics · 1995 · 406 citations

Engineering, Mechatronics Engineering, Digital Imaging +16