Interferometric Surface Profilometry
Interferometric Surface Profilometry is a non-contact optical measurement technique that uses the interference of coherent light waves to determine surface topography with nanometer-level precision by analyzing the phase differences between reference and sample beams.
233
Publications
12.7K
Citations
659
Authors
216
Institutions
Publications per year
2017–2026
37
Parents
233
Optical Interferometry of Surfaces
Glen M. Robinson, David Perry, Richard W. Peterson · Scientific American · 1991 · 361 citations
Natural Sciences, Physics, Optics +11
Improved vertical-scanning interferometry
Akiko Harasaki, Joanna Schmit, James C. Wyant · Applied Optics · 2000 · 275 citations · Full text
Engineering, Manufacturing Engineering, Biomedical Optics +14
1–5 of 233
659
6
h-index
National Institute of Advanced Industrial Science and Technology, Japan
4 publications · 81 citations
4
h-index
4
h-index
4
h-index
4
h-index
1–5 of 659
216
University of Arizona
Tucson, United States
7 h-index
16 publications
1.3K citations
Nanyang Technological University
Singapore, Singapore
5 h-index
16 publications
493 citations
Pusan National University
Busan, South Korea
5 h-index
16 publications
276 citations

Chinese Academy of Sciences
Beijing, China
5 h-index
22 publications
720 citations
The University of Tokyo
Tokyo, Japan
5 h-index
12 publications
238 citations
Korea Advanced Institute of Science and Technology
Daejeon, South Korea
5 h-index
20 publications
453 citations
Loughborough University
Loughborough, United Kingdom
4 h-index
6 publications
120 citations
Tianjin University
Tianjin, China
4 h-index
11 publications
413 citations
1–8 of 216
35 publications · 1.2K citations
21
h-index
24 publications · 1.2K citations
17
h-index
16 publications · 354 citations
12
h-index
10 publications · 321 citations
10
h-index
10 publications · 207 citations
10
h-index
1–5