Interferometric Surface Profilometry

Interferometric Surface Profilometry is a non-contact optical measurement technique that uses the interference of coherent light waves to determine surface topography with nanometer-level precision by analyzing the phase differences between reference and sample beams.

233

Publications

12.7K

Citations

659

Authors

216

Institutions

Publications per year

2017–2026

37

Authors

659

  1. YK
    Yangjin Kim

    The University of Tokyo, Japan

    6 publications · 105 citations

    6

    h-index

  2. KH
    Kenichi Hibino

    National Institute of Advanced Industrial Science and Technology, Japan

    4 publications · 81 citations

    4

    h-index

  3. ST
    S. Tolansky

    Royal Holloway University of London, United Kingdom

    4 publications · 54 citations

    4

    h-index

  4. KV
    Krishnan Venkatakrishnan

    Toronto Metropolitan University, Canada

    4 publications · 99 citations

    4

    h-index

  5. NS
    Naohiko Sugita

    The University of Tokyo, Japan

    4 publications · 69 citations

    4

    h-index

1–5 of 659

Venues

  1. Optics and Lasers in Engineering

    35 publications · 1.2K citations

    21

    h-index

  2. Applied Optics

    24 publications · 1.2K citations

    17

    h-index

  3. 12

    h-index

  4. Optics Express

    10 publications · 321 citations

    10

    h-index

  5. Optics Communications

    10 publications · 207 citations

    10

    h-index

1–5