Mitsuo Takeda - Concepedia

Author

Mitsuo Takeda

University of Electro-Communications

Also Known As

M Takeda, M. Takeda, MITSUO TAKEDA, Mitsuo Takeda, Mitsuo Wada Takeda

182

Publications

Citations

H-Index

111

Concepts

All Affiliations

University of Electro-Communications Utsunomiya University University of Stuttgart Indian Institute of Space Science and Technology Heriot-Watt University

About

Mitsuo Takeda is an author at University of Electro-Communications specializing in engineering, interferometry, and microscopy.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	27	44	8.3K
2	Natural Sciences	7	7	2.3K
3	Education	6	6	365
4	Medicine	4	4	147
5	Health Sciences	1	1	25

Mitsuo Takeda

Publications

8.5K

Citations

H-Index

Page 1

	Year	Citations
Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry Mitsuo Takeda, Hideki Ina, Seiji Kobayashi Journal of the Optical Society of America EngineeringInterferometryDigital HolographyImage AnalysisCoherent Gradient Sensing	1982	4.2K
Fourier transform profilometry for the automatic measurement of 3-D object shapes Mitsuo Takeda, Kazuhiro Mutoh Applied Optics 3-D Object ShapesEngineeringSpurious Moire FringesGeometryMeasurement	1983	1.8K
Neural networks for computation: number representations and programming complexity Mitsuo Takeda, Joseph W. Goodman Applied Optics Mathematical ProgrammingRedundant SchemesRecurrent Neural NetworkEngineeringCellular Neural Network	1986	214
Frequency-multiplex Fourier-transform profilometry: a single-shot three-dimensional shape measurement of objects with large height discontinuities and/or surface isolations Mitsuo Takeda, Quan Gu, Masaya Kinoshita, Applied Optics HolographyEngineeringMeasurementInterferometryComputer-aided Design	1997	213
Fourier-transform speckle profilometry: three-dimensional shape measurements of diffuse objects with large height steps and/or spatially isolated surfaces Mitsuo Takeda, H. Yamamoto Applied Optics EngineeringMicroscopyInterferometric TechniqueDiffuse ObjectsOptical Testing	1994	196
Spatial-carrier fringe-pattern analysis and its applications to precision interferometry and profilometry: An overview Mitsuo Takeda Industrial Metrology RadarEngineeringMeasurementCalibrationSpatial-carrier Fringe-pattern Analysis	1990	155
Optical vortex metrology for nanometric speckle displacement measurement Wei Wang, Tomoaki Yokozeki, Reika Ishijima, Optics Express EngineeringCoherent Gradient SensingMicroscopyOptical PropertiesSpeckle Pattern	2006	140
Exploiting scattering media for exploring 3D objects Alok Kumar Singh, Dinesh N. Naik, Giancarlo Pedrini, Light Science & Applications	2016	134
Laser speckle reduction by multimode optical fiber bundle with combined temporal, spatial, and angular diversity Dalip Singh Mehta, Dinesh N. Naik, Rakesh Kumar Singh, Applied Optics PhotonicsEngineeringLaser Speckle ReductionAngular DiversityOptical Fiber Bundle	2012	111
Optical vortex metrology based on the core structures of phase singularities in Laguerre-Gauss transform of a speckle pattern Wei Wang, Tomoaki Yokozeki, Reika Ishijima, Optics Express RadarVortex DynamicsPhase RetrievalEngineeringVortex Flows	2006	106

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