Applied Optics · 2000 · 275 citations · 34 references
EngineeringManufacturing EngineeringBiomedical OpticsDigital ImagingMetrologyInterferometryOptical CoherenceOptical MetrologyPhase AnalysisInterferometric MeasurementInterferometric MetrologyInterferometric Surface MeasurementInterferometric Surface ProfilometryModulation ContrastOptical InterferometryPhase Shifting InterferometryPhase Unwrapping
We describe a method that combines phase-shifting and coherence-peak-sensing techniques to permit measurements with the height resolution of phase-shifting interferometry without the interval-slope limitation of lambda/4 per data sample of phase-shifting interferometry. A five-frame algorithm is used to determine both the best-focus frame position and the fractional phase from the best-focus frame of the correlogram acquired through vertical scanning. The two surface profiles retrieved from the phase and the modulation contrast of the correlograms are compared in the phase-unwrapping process to remove fringe-order ambiguity.
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<i>Linear Systems, Fourier Transforms and Optics</i>
Jack D. Gaskill, R. N. Bracewell · Physics Today · 1979 · 637 citations
Two-wavelength phase shifting interferometry
Yeou-Yen Cheng, James C. Wyant · Applied Optics · 1984 · 432 citations
Engineering, Physics, Metrology +16