Interferometric Surface Measurement

Interferometric Surface Measurement is a non-contact optical metrology technique that uses the interference of coherent light waves to precisely quantify surface topography by detecting phase differences between reference and specimen beams.

495

Publications

17.4K

Citations

1.2K

Authors

339

Institutions

Publications per year

2017–2026

64

Variants

Interferometric Surface Metrology

Authors

1.2K

  1. JC
    James C. Wyant

    University of Arizona, United States

    15 publications · 1.6K citations

    14

    h-index

  2. JH
    James H. Burge

    University of Arizona, United States

    14 publications · 408 citations

    13

    h-index

  3. PJ
    Peter J. de Groot

    Zygo (United States), United States

    12 publications · 385 citations

    12

    h-index

  4. WO
    Wolfgang Osten

    University of Stuttgart, Germany

    12 publications · 416 citations

    11

    h-index

  5. RL
    Richard Leach

    University of Nottingham, United Kingdom

    9 publications · 419 citations

    9

    h-index

1–5 of 1.2K

Venues

  1. Applied Optics

    84 publications · 4.8K citations

    40

    h-index

  2. 24

    h-index

  3. Optics Letters

    25 publications · 940 citations

    19

    h-index

  4. Optical Engineering

    38 publications · 1.1K citations

    19

    h-index

  5. Optics Express

    31 publications · 878 citations

    19

    h-index

1–5