Interferometric Surface Measurement
Interferometric Surface Measurement is a non-contact optical metrology technique that uses the interference of coherent light waves to precisely quantify surface topography by detecting phase differences between reference and specimen beams.
495
Publications
17.4K
Citations
1.2K
Authors
339
Institutions
Publications per year
2017–2026
64
Variants
Interferometric Surface Metrology
Parents
495
Two-wavelength phase shifting interferometry
Yeou-Yen Cheng, James C. Wyant · Applied Optics · 1984 · 432 citations
Engineering, Physics, Metrology +16
Multiple-wavelength phase-shifting interferometry
Yeou-Yen Cheng, James C. Wyant · Applied Optics · 1985 · 309 citations
Improved vertical-scanning interferometry
Akiko Harasaki, Joanna Schmit, James C. Wyant · Applied Optics · 2000 · 275 citations · Full text
Engineering, Manufacturing Engineering, Biomedical Optics +14
Step height measurement using two-wavelength phase-shifting interferometry
Katherine Creath · Applied Optics · 1987 · 260 citations
Engineering, Physics, Metrology +16
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1.2K
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339
University of Arizona
Tucson, United States
25 h-index
98 publications
5.3K citations
Zygo (United States)
Middlefield, United States
15 h-index
28 publications
1K citations
University of Stuttgart
Stuttgart, Germany
12 h-index
42 publications
1.5K citations

National Physical Laboratory
London, United Kingdom
11 h-index
19 publications
743 citations

Chinese Academy of Sciences
Beijing, China
10 h-index
35 publications
993 citations

Niigata University
Niigata, Japan
10 h-index
24 publications
1K citations
Loughborough University
Loughborough, United Kingdom
9 h-index
15 publications
842 citations

Commonwealth Scientific and Industrial Research Organisation
Canberra, Australia
9 h-index
20 publications
471 citations
1–8 of 339
84 publications · 4.8K citations
40
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61 publications · 1.6K citations
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25 publications · 940 citations
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38 publications · 1.1K citations
19
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31 publications · 878 citations
19
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