Journal of Physics E Scientific Instruments

Determination of the thickness and optical constants of amorphous silicon

R. Swanepoel · 1983 · 3.9K citations

Natural Sciences, Materials Engineering, Materials Science +17

A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film

J.-C. Manifacier, J. Gasiot, J.P. Fillard · 1976 · 1.7K citations

Natural Sciences, Materials Science, Optical Materials +16

Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films

R. Swanepoel · 1984 · 721 citations

Natural Sciences, Materials Engineering, Materials Science +17

Applied potential tomography

D C Barber, Brian Brown · 1984 · 721 citations

Natural Sciences, Physics, Physiology +13

Magnetic field paralleliser for 2π electron-spectrometer and electron-image magnifier

P. Kruit, F H Read · 1983 · 679 citations

Natural Sciences, Physics, Optics +15