Peter J. de Groot

Surface Profiling by Analysis of White-light Interferograms in the Spatial Frequency Domain

Peter J. de Groot, L. Deck · Journal of Modern Optics · 1995 · 406 citations

Engineering, Mechatronics Engineering, Digital Imaging +16

Principles of interference microscopy for the measurement of surface topography

Peter J. de Groot · Advances in Optics and Photonics · 2015 · 389 citations

Engineering, Manufacturing Engineering, Mechanical Engineering +17

High-speed noncontact profiler based on scanning white-light interferometry

L. Deck, Peter J. de Groot · Applied Optics · 1994 · 386 citations

Engineering, Physics, Metrology +16

Derivation of algorithms for phase-shifting interferometry using the concept of a data-sampling window

Peter J. de Groot · Applied Optics · 1995 · 239 citations

Engineering, Computational Engineering, Computational Mechanics +13

Measurement of transparent plates with wavelength-tuned phase-shifting interferometry

Peter J. de Groot · Applied Optics · 2000 · 206 citations

Natural Sciences, Physics, Metrology +15