Statistics
Publications
548
Citations
18.5K
Authors
50
Location
Middlefield, United States
548
High-speed noncontact profiler based on scanning white-light interferometry
L. Deck, Peter J. de Groot · Applied Optics · 1994 · 386 citations
Engineering, Physics, Metrology +16
Material Removal Mechanisms in Lapping and Polishing
C. J. Evans, E. Paul, D. Dornfeld et al. · CIRP Annals · 2003 · 383 citations · Full text
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