Optical Metrology

Optical Metrology is a branch of metrology that employs optical techniques and principles of optics and photonics to perform high-precision measurement of physical quantities, distinguished by its use of light-based methods for achieving non-contact, accurate, and often real-time quantification.

16.4K

Publications

703.1K

Citations

36.8K

Authors

4.5K

Institutions

Publications per year

2017–2026

3K

Authors

36.8K

  1. SZ
    Song Zhang

    Purdue University West Lafayette, United States

    51 publications · 4.4K citations

    35

    h-index

  2. SK
    Seung‐Woo Kim

    Korea Advanced Institute of Science and Technology, South Korea

    48 publications · 3K citations

    28

    h-index

  3. XS
    Xianyu Su

    Sichuan University, China

    47 publications · 2.5K citations

    27

    h-index

  4. RT
    Rick Trebino

    Georgia Institute of Technology, United States

    48 publications · 4K citations

    27

    h-index

  5. JC
    James C. Wyant

    University of Arizona, United States

    44 publications · 3.5K citations

    27

    h-index

1–5 of 36.8K

Venues

  1. Applied Optics

    2K publications · 94.1K citations

    125

    h-index

  2. Optics Express

    1.2K publications · 53.8K citations

    99

    h-index

  3. Optics Letters

    910 publications · 47.2K citations

    97

    h-index

  4. Optical Engineering

    588 publications · 23.5K citations

    61

    h-index

  5. Physical Review Letters

    PRL · 99 publications · 17.4K citations

    61

    h-index

1–5