Optical Metrology
Optical Metrology is a branch of metrology that employs optical techniques and principles of optics and photonics to perform high-precision measurement of physical quantities, distinguished by its use of light-based methods for achieving non-contact, accurate, and often real-time quantification.
16.4K
Publications
703.1K
Citations
36.8K
Authors
4.5K
Institutions
Publications per year
2017–2026
3K
16.4K
Vittorio Giovannetti, Seth Lloyd, Lorenzo Maccone · Nature Photonics · 2011 · 3.9K citations · Full text
Natural Sciences, Physics, Metrology +11
Michael Hentschel, Reinhard Kienberger, Christian Spielmann et al. · Nature · 2001 · 2.8K citations
Natural Sciences, Physics, Optics +12
1–5 of 16.4K
36.8K
35
h-index
Korea Advanced Institute of Science and Technology, South Korea
48 publications · 3K citations
28
h-index
27
h-index
27
h-index
27
h-index
1–5 of 36.8K
4.5K
National Institute of Standards and Technology
Gaithersburg, United States
77 h-index
1.3K publications
107.8K citations

Centre National de la Recherche Scientifique
Paris, France
60 h-index
1K publications
58.3K citations

Physikalisch-Technische Bundesanstalt
Braunschweig, Germany
48 h-index
772 publications
47.4K citations
The University of Tokyo
Tokyo, Japan
45 h-index
431 publications
29.1K citations

University of Rochester
Rochester, United States
45 h-index
337 publications
28.4K citations
University of Arizona
Tucson, United States
44 h-index
438 publications
19.1K citations

National Physical Laboratory
London, United Kingdom
44 h-index
348 publications
17.8K citations
Tsinghua University
Beijing, China
44 h-index
644 publications
23.5K citations
1–8 of 4.5K
2K publications · 94.1K citations
125
h-index
1.2K publications · 53.8K citations
99
h-index
910 publications · 47.2K citations
97
h-index
588 publications · 23.5K citations
61
h-index
PRL · 99 publications · 17.4K citations
61
h-index
1–5