Fourier Transform Profilometry
Fourier Transform Profilometry is a non-contact optical measurement technique that belongs to the class of fringe projection profilometry methods, distinguished by its use of Fourier transform analysis to extract three-dimensional surface topography from a single fringe pattern by demodulating the carrier frequency in the spatial frequency domain.
125
Publications
8.1K
Citations
305
Authors
115
Institutions
Publications per year
2017–2026
24
Parents
125
Fringe pattern analysis using deep learning
Advanced Photonics · 2019 · 430 citations · Full text
Lei Huang, Qian Kemao, Bing Pan et al. · Optics and Lasers in Engineering · 2009 · 323 citations
Natural Sciences, Materials Engineering, Materials Science +16
Mitsuo Takeda, Quan Gu, Masaya Kinoshita et al. · Applied Optics · 1997 · 213 citations
1–5 of 125
305
14
h-index
12
h-index
8
h-index
7
h-index
6
h-index
1–5 of 305
115

Sichuan University
Chengdu, China
20 h-index
88 publications
3.2K citations
Nanjing University of Science and Technology
Nanjing, China
9 h-index
52 publications
6.4K citations

Centre National de la Recherche Scientifique
Paris, France
6 h-index
25 publications
2.2K citations
Physique et Mécanique des Milieux Hétérogènes
Paris, France
5 h-index
18 publications
1.4K citations
Liverpool John Moores University
Liverpool, United Kingdom
5 h-index
14 publications
482 citations
Le Mans Université
Le Mans, France
3 h-index
3 publications
325 citations
National University of Singapore
Singapore, Singapore
3 h-index
8 publications
418 citations
Nanchang Hangkong University
Nanchang, China
3 h-index
11 publications
417 citations
1–8 of 115
19 publications · 1.3K citations
17
h-index
16 publications · 2.9K citations
16
h-index
11 publications · 552 citations
11
h-index
9 publications · 299 citations
9
h-index
8 publications · 284 citations
8
h-index
1–5