Xavier Colonna de Lega

Determination of fringe order in white-light interference microscopy

Peter J. de Groot, Xavier Colonna de Lega, Jim Kramer et al. · Applied Optics · 2002 · 197 citations

Engineering, Ophthalmology, Microscopy +15

Signal modeling for low-coherence height-scanning interference microscopy

Peter J. de Groot, Xavier Colonna de Lega · Applied Optics · 2004 · 158 citations

High Resolution, Engineering, Microscopy +18

Optical interferometry for measurement of the geometric dimensions of industrial parts

Peter J. de Groot, J F. Biegen, Jack Clark et al. · Applied Optics · 2002 · 58 citations

Engineering, Measurement, Industrial Engineering +22

Transparent film profiling and analysis by interference microscopy

Peter J. de Groot, Xavier Colonna de Lega · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2008 · 45 citations

Optical Materials, Engineering, Microscopy +17

Deformation measurement with object-induced dynamic phase shifting

Xavier Colonna de Lega, Pierre Jacquot · Applied Optics · 1996 · 44 citations

Phase Transitions, Engineering, Measurement +17