2023 · 10 citations · 5 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesVlsi DesignCmos Circuit DesignDevice ModelingDevice SimulationIntegrated Circuit DesignMemory DevicesMemory Hierarchy DesignMemory Circuit DesignMetal-oxide-semiconductor Field-effect Transistor ModelingSiliconSilicon Device SimulationTechnological Feasibility
In this work, a novel 4F <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> VCT (vertical channel transistor) targeting for next generation of DRAM is proposed. We approached process feasibility and device performance of $\mathbf{4 F}^{2}$ VCT by TCAD simulation. Detailed processes such as BL (bit line) and WL (word line) loop have also been discussed to achieve lx node VCT DRAM. For the first time, silicon demonstration for $8\mathrm{~Gb}$ full array VCT with density as high as $198\ \mathrm{Mbit}/\mathrm{mm}^{2}$ is successfully realized. Besides, we also demonstrated standard switching behavior of VCT access transistor with reasonable device performance.
5
Future of dynamic random-access memory as main memory
Seong Keun Kim, M. Popovici · MRS Bulletin · 2018 · 185 citations
Memory technology trend and future challenges
Sung-Joo Hong · 2010 · 106 citations
Engineering, Computer Engineering, Electrical Engineering +17
A History of Microprocessor Development at Intel
Robert N. Noyce, Marcian E. Hoff · IEEE Micro · 1981 · 77 citations