APL Materials · 2022 · 33 citations · 40 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsElectrode MaterialsLeakage Power ReductionMetal-semiconductor ContactsSemiconductor Device MaterialsThin Film Electrical PropertiesWide Band Gap SemiconductorsBreakdown VoltageHigh-permittivity MaterialsLeakageSchottky Barrier CharacteristicsSchottky Barrier ContactsSchottky Barrier DiodesSchottky BarriersSchottky Contacts
We report on vertical β-Ga2O3 power diodes with oxidized-metal Schottky contact (PtOx) and high permittivity (high-κ) dielectric (ZrO2) field plate to improve reverse blocking at both Schottky contact surfaces and edges. The PtOx diodes showed excellent forward transport with near unity ideality factor and similar minimum specific on-resistance as Pt. Moreover, the PtOx contacts facilitated higher breakdown voltage and lower leakage current due to their higher Schottky barrier height (SBH) by more than 0.5 eV compared to that of Pt. Most importantly, the reduced off-state leakage of PtOx diodes enabled orders of magnitude less power dissipation than Pt ones for all duty cycles ≤0.5, indicating their great potential to realize low-loss and efficient, high-power β-Ga2O3 switches. The ZrO2 field-oxide further reduced edge leakage with a consistent increase in breakdown voltage. Device simulation demonstrated that the high permittivity of ZrO2 also led to the peak electric field occurring in β-Ga2O3 instead of the dielectric. These results indicate that the combined integration of oxidized-metal contacts to increase SBH and high-κ dielectric field plate to assist edge termination can be promising to enhance the performance of vertical β-Ga2O3 Schottky diodes.
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1-kV vertical Ga2O3 field-plated Schottky barrier diodes
Keita Konishi, Ken Goto, Hisashi Murakami et al. · Applied Physics Letters · 2017 · 576 citations
β-Gallium oxide power electronics
Andrew J. Green, James S. Speck, Grace Xing et al. · APL Materials · 2022 · 506 citations · Full text