International Test Conference · 1985 · 36 citations · 0 references
EngineeringComputer EngineeringElectrical EngineeringAlgorithmsMicroelectronicsSemiconductor DevicesBuilt-in Self-testCmos Circuit DesignDesign For TestabilityDevice CharacterizationDevice ModelingElectrical System TestingAnalog TestabilityAutomatic Test Pattern GenerationBuilt-in Self-test For Analog CircuitsDesign For ScanabilityOn-chip Test Pattern Generation