Microstructure and mechanical behavior of SnBi-xAg and SnBi-xAg@P-Cu solder joints during isothermal aging

Yang Liu, Boqiao Ren, Yuxiong Xue, Min Zhou, Rongxing Cao, Penghui Chen, Xianghua Zeng

Microelectronics Reliability · 2021 · 19 citations · 23 references

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