Compact and complete test set generation for multiple stuck-faults

Abstract

We propose a novel procedure for testing all multiple stuck-faults in a logic circuit using two complementary algorithms. The first algorithm finds pairs of input vectors to detect the occurrence of target single stuck-faults independent of the occurrence of other faults. The second uses a sophisticated branch and bound procedure to complete the test set generation on the faults undetected by the first algorithm. The technique is complete and applies to all circuits. Experimental results presented in this paper demonstrate that compact and complete test sets can be quickly generated for standard benchmark circuits.