Radiation Physics and Chemistry · 2020 · 18 citations · 17 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesElectron Beam PhysicsIii-v SemiconductorsRadiation Damage In MaterialsSemiconductor Device MaterialsWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsElectron Beam Irradiation EffectsPower MosfetsRadiation EffectsSilicon CarbideSilicon Carbide Power Devices
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G. J. Dienes · Annual Review of Nuclear Science · 1953 · 559 citations
C.E. Mandeville · Journal of the Franklin Institute · 1958 · 202 citations
1/f noise in MODFETs at low drain bias
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