Optical characterization of sputtered aluminum nitride thin films – correlating refractive index with degree of c-axis orientation

A. Ababneh, Zaid Albataineh, Ahmad Dagamseh, I.S. Al-Kofahi, Bruno Schäfer, T. Zengerle, Karin Bauer, H. Seidel

Thin Solid Films · 2019 · 26 citations · 36 references

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