2019 · 15 citations · 11 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSemiconductor MaterialsCarrier TransportComplementary Metal-oxide-semiconductor TechnologyDopingIntegrated Circuit DesignMetal-oxide-semiconductor Field-effect TransistorsSemiconductor PhysicsCharge Balance ControlComplementary Metal-oxide-semiconductor BiasingDepletion RegionDepletion Region EngineeringDepletion-mode TransistorsMetal-oxide-semiconductor Field-effect Transistor Modeling
A novel lateral double-diffused metal-oxide semiconductor (LDMOS) with three-dimensional floating vertical field plate (3-D F-VFP) is proposed in this paper. The 3-D F-VFP LDMOS features a discrete pillar-type VFP array through the N-type drift region and the VFP pillars with the same distance from the source are connected to each other to realize the equal potential. In the off-state, the potential along the drift region are pinned by the series of equal-potential F-VFP rings and a new full-region depletion mode is introduced into the bulk of the device. Therefore, the highly doped drift region is depleted by the 3-D F-VFP, establishing a self-adaptive charge balance inside the drift region. In the on-state, the current flows through the gaps among all the F-VFP pillars, preventing the long current path and reducing the on resistance R <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</sub> . A 3-D F-VFP LDMOS is experimentally implemented, which obtains a breakdown voltage V <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">B</sub> of 630 V and a Ron of 344.8 Ω compared with 550 V and 722.5 Ω of the device without the F-VFP. The measured saturation current of the 3-D F-VFP LDMOS is more than 4.5 times of that of the device without F-VFP.
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Novel Superjunction LDMOS (>950 V) With a Thin Layer SOI
Wentong Zhang, Zhenya Zhan, Yang Yu et al. · IEEE Electron Device Letters · 2017 · 46 citations