IEEE Transactions on Electron Devices · 2019 · 55 citations · 33 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsCarrier TransportDopingMetal-oxide-semiconductor Field-effect TransistorsNanowiresSemiconductor Device MaterialsSemiconductor PhysicsCarrier ConcentrationChannel DopingNanowire Field-effect TransistorsNanowire TransistorsSemiconductor DopingSemiconductor NanowiresSiliconSilicon Dioxide
In this paper, we have proposed dopingless gate all around (GAA) nanowire tunnel field-effect transistor (NWTFET) made up of dual-material channel (DMaC). Charge-plasma (CP) technique is used to induce the doping concentration of charge carriers in the intrinsic semiconductor. GAA structure uses zirconium silicate (IV) (ZrSiO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</sub> )/silicon dioxide (SiO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> ) for heterogeneous gate (HG) structure metalized with two different gate metals. Auxiliary gate (GM1) and tunneling gate (GM2) have different work functions, i.e., φ <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1</sub> and φ <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> . The device physics is analyzed using electric field, charge carrier concentration, energy-band diagram, and tunneling rate across the structure. The effect of variation in φ <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1</sub> and φ <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> helps in the analysis of the ambipolar and analog behavior of the proposed device CP-dual metal-HG-DMaC-NWTFET. The reported ON-state current is 5.54 μA/μm, and the OFF-state current is approximately 0.1 aA/μm. The proposed device showed negligible ambipolar current (10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-19</sup> A/μm) as negative bias increases to V <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">GS</sub> = -0.8 V making the device compatible for low-voltage applications.
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Complementary tunneling transistor for low power application
Pengzhan Wang, K. Hilsenbeck, T. Nirschl et al. · Solid-State Electronics · 2004 · 519 citations
Engineering, Electrical Engineering, Electronic Materials +10