Publication | Closed Access
Progressive drain damage in SiC power MOSFETs exposed to ionizing radiation
18
Citations
8
References
2018
Year
Electrical EngineeringIon ImplantationEngineeringPower DeviceBias Temperature InstabilityProgressive Drain DamagePower Semiconductor DeviceSingle Event EffectsSic Power Mosfets
| Year | Citations | |
|---|---|---|
Page 1
Page 1