Journal of Computational Electronics · 2018 · 22 citations · 37 references
EngineeringElectrical EngineeringPhysicsElectronic MaterialsMicroelectronicsSemiconductor DevicesCarrier TransportField-effect TransistorsMetal-oxide-semiconductor Field-effect TransistorsSemiconductor PhysicsThin Film Electrical PropertiesThin-film TransistorsAmbipolar TransportGate LeakageGate Leakage CurrentGate Oxide LeakageLeakage Current Reduction
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