IEEE Transactions on Electron Devices · 2017 · 18 citations · 27 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsOxide SemiconductorsSemiconductor Device MaterialsSemiconductor Thin FilmsThin-film MaterialsThin-film TransistorsTransparent Conducting OxidesCarrier MobilityFabricationFlexible ElectronicsFlexible SubstratesPolyethylene TerephthalatePower ConsumptionTransparent Conducting ElectrodesTransparent Conductive Oxides
With the development of novel device applications, e.g., in the field of Internet of Things or point-of-care personalized diagnostic systems, came an increased demand for MESFETs for fast and low-power consumption integrated circuits and active-matrix displays. In this paper, we present fabrication and characterization of transparent Ru-Si-O/In-Ga-Zn-O MESFETs on flexible substrates. The use of transparent conducting oxide, namely, Ru-Si-O, as Schottky gate electrode, allows for processing the devices at room temperature, enabling the utilization of such low-temperature substrates as polyethylene terephthalate foil and paper. It was shown that tuning the device geometry allows realization of transistors providing on-current up to 2 mA, while the highest on-to-off current ratio equals 2 × 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">5</sup> , with off-current below 1 nA, carrier mobility in the channel exceeds 9 cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> ·V <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-1</sup> ·s <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-1</sup> , and subthreshold swing is below 250 mV·decade <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-1</sup> .
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ZnO Schottky barriers and Ohmic contacts
L. J. Brillson, Yicheng Lu · Journal of Applied Physics · 2011 · 678 citations