Publication | Closed Access
N-Polar GaN Cap MISHEMT With Record Power Density Exceeding 6.5 W/mm at 94 GHz
109
Citations
21
References
2017
Year
Wide-bandgap SemiconductorElectrical EngineeringEngineeringRf SemiconductorPhysicsNanoelectronicsApplied PhysicsN-polar GanAluminum Gallium NitrideGan Power DevicePower ElectronicsMicroelectronicsAccess Region ConductivityCategoryiii-v SemiconductorInherent Polarization Fields
A novel N-Polar GaN cap (MIS)high electron mobility transistor demonstrating record 6.7-W/mm power density with an associated power-added efficiency of 14.4% at 94 GHz is presented. This state-of-the-art power performance is enabled by utilizing the inherent polarization fields of N-Polar GaN in combination with a 47.5-nm in situ GaN cap layer to simultaneously mitigate dispersion and improve access region conductivity. These excellent results build upon past work through the use of optimized device dimensions and a transition from a sapphire to a substrate for reduced self-heating.
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