Cubic Single-Crystalline Si[sub 1−x−y]C[sub x]N[sub y] Films with Mirror Face Prepared by RTCVD

S.F. Ting, Yean-Kuen Fang, Wen-Tse Hsieh, Yong-Shiuan Tsair, Cheng-Nan Chang, Chunsheng Lin, Ming-Chun Hsieh, Hsin-Che Chiang, Jyh‐Jier Ho

Electrochemical and Solid-State Letters · 2001 · 11 citations · 3 references

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Abstract

This paper reports the growth of single-crystalline silicon carbon nitride films on crystal silicon substrate using for carbon source by rapid thermal chemical vapor deposition (RTCVD). Based on the scanning electron microscope analysis, the films are smooth on the surface and at the interface, which is important for device applications. A model to explain the growing mechanism of the film is being proposed. © 2001 The Electrochemical Society. All rights reserved.

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