Physics of the Solid State · 2016 · 23 citations · 9 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsSurface ScienceEpitaxial GrowthSemiconductor Crystal GrowthSemiconductor Device MaterialsSemiconductor InterfacesSemiconductor PhysicsSemiconductor SurfacesEpitaxial Film MorphologyEpitaxial Growth KineticsEpitaxial Growth MorphologyEpitaxial InterfacesEpitaxial MaterialsMolecular Beam EpitaxySemiconductor CharacterizationSurface States
A thermodynamic analysis of processes of interphase interaction in the Ga–As–O system has been performed and their theoretical laws have been determined, taking into account nonlinear thermal physical properties of the compounds, the oxide film compositions, and modes of molecular-beam epitaxy of GaAs. The processes of interaction of the native oxide of GaAs with the substrate material and also with Ga and As 4 from a vapor gaseous phase have been studied experimentally. The experimental results correlate with the results of the thermodynamic analysis. The laws of influence of the removal of the proper oxide on the evolution of the GaAs surface morphology under conditions of the molecular-beam epitaxy have been proposed.
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Characterization of wet‐etched GaAs (100) surfaces
M. Rei Vilar, J. El Beghdadi, F. Debontridder et al. · Surface and Interface Analysis · 2005 · 94 citations
Natural Sciences, Materials Engineering, Materials Science +17
Characterization of oxide layers on GaAs substrates
D. A. Allwood, R. T. Carline, N. J. Mason et al. · Thin Solid Films · 2000 · 63 citations · Full text