Microelectronics Reliability · 2004 · 34 citations · 2 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesCarrier TransportDevice CharacterizationField-effect TransistorsIntegrated Circuit DesignMetal-oxide-semiconductor Field-effect TransistorsSemiconductor ReliabilityHot Carrier DynamicsHot Carrier EffectsHot Carrier Injection
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A novel hot-hole injection degradation model for lateral nDMOS transistors
P. Moens, M. Tack, R. Degraeve et al. · 2002 · 54 citations