Publication | Closed Access
Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability
25
Citations
135
References
2016
Year
ReliabilityElectrical ReliabilityElectrical EngineeringReliability EngineeringEngineeringHardware ReliabilityNanoelectronicsInterconnect (Integrated Circuits)Low-k/cu InterconnectsElectrical InsulationBand DiagramCircuit ReliabilityElectronic PackagingDevice ReliabilityMicroelectronicsPhysic Of FailureElectromagnetic Compatibility
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