Correlation of Stress in Silicon Carbide Crystal and Frequency Shift in Micro-Raman Spectroscopy - Concepedia

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Correlation of Stress in Silicon Carbide Crystal and Frequency Shift in Micro-Raman Spectroscopy

22

Citations

6

References

2014

Year

Naohiro Sugiyama, M. Yamada, Yasushi Urakami, Masakazu Kobayashi, Takashi Masuda, Koichi Nishikawa, Fusao Hirose, Shoichi Onda

MRS Proceedings

Materials ScienceSpectroscopic MethodSilicon Carbide CrystalMicro-raman SpectroscopyEngineeringSpectroscopyApplied PhysicsCarbideSpectroscopic PropertyFrequency ShiftMicrostructure

References

	Year	Citations

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