IEEE Transactions on Microwave Theory and Techniques · 2000 · 36 citations · 6 references
EngineeringElectrical EngineeringMicroelectronicsMicrowave EngineeringSemiconductor DevicesBipolar Junction TransistorsHigh-frequency Semiconductor DevicesMicrowave AmplifiersMicrowave Integrated CircuitsMicrowave Semiconductor DevicesPower AmplifiersElectrothermal SimulationHeterojunction Bipolar TransistorsMicrowave Amplifier CharacterizationMicrowave DevicesMicrowave Power TransistorsMicrowave TransistorsNonlinear Device CharacterizationThermal Effects In Microwave Devices
This paper presents a new automated and vector error-corrected active load-pull system allowing the characterization of microwave power transistors under coherent pulsed RF and pulsed DC operating conditions. In this paper, the use of this system is focused on the characterization of a 240-/spl mu/m/sup 2/ GaInP-GaAs heterojunction bipolar transistor (HBT) (Thomson CSP-LCR, Orsay, France). On one hand, source and load-pull measurements of such a transistor are reported for different pulsewidths. On the other hand, nonlinear simulations based on an electrothermal model of an HBT have been performed and are compared with experiments. Power variations and RF carrier phase shift within the pulse versus input power and junction temperature of the transistor are shown.
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Denis Barataud, F. Blache, Alain Mallet et al. · IEEE Transactions on Instrumentation and Measurement · 1999 · 74 citations
Denis Barataud, C. Arnaud, B. Thibaud et al. · IEEE Transactions on Instrumentation and Measurement · 1998 · 63 citations