Nonlinear Device Characterization

Nonlinear Device Characterization is a modeling methodology that distinguishes itself by systematically extracting and quantifying the nonlinear electrical behavior of microwave semiconductor devices under large-signal operating conditions to enable accurate prediction of harmonic distortion, intermodulation, and other nonlinear phenomena in high-frequency circuits.

437

Publications

19.9K

Citations

1.3K

Authors

391

Institutions

Publications per year

2017–2026

Parents

Device ModelingMicrowave Semiconductor Devices

Publications

437

A Powder Technique for the Evaluation of Nonlinear Optical Materials

S. K. Kurtz, T. T. Perry · Journal of Applied Physics · 1968 · 6.1K citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16

Dynamic Behavioral Modeling of 3G Power Amplifiers Using Real-Valued Time-Delay Neural Networks

T. Liu, Slim Boumaiza, Fadhel M. Ghannouchi · IEEE Transactions on Microwave Theory and Techniques · 2004 · 322 citations

Engineering, Computational Engineering, Electrical Engineering +17

Extensions of the Chalmers nonlinear HEMT and MESFET model

I. Angelov, Lars Bengtsson, M.C. Alonso‐García · IEEE Transactions on Microwave Theory and Techniques · 1996 · 299 citations

Engineering, Electrical Engineering, Microelectronics +16

Radio Frequency Fingerprint Identification for Narrowband Systems, Modelling and Classification

Junqing Zhang, Roger Woods, Magnus Sandell et al. · IEEE Transactions on Information Forensics and Security · 2021 · 222 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +16

A Comprehensive Crossbar Array Model With Solutions for Line Resistance and Nonlinear Device Characteristics

An Chen · IEEE Transactions on Electron Devices · 2013 · 220 citations

Engineering, Electrical Engineering, Circuit Theory +15

1–5 of 437

Authors

1.3K

DS
Dominique Schreurs
KU Leuven, Belgium
27 publications · 729 citations
16
h-index
AR
Antonio Raffo
University of Ferrara, Italy
18 publications · 577 citations
13
h-index
RQ
Raymond Quéré
Université de Limoges, France
15 publications · 334 citations
13
h-index
GV
G. Vannini
University of Ferrara, Italy
19 publications · 534 citations
13
h-index
JV
Jan Verspecht
Agilent Technologies (United States), United States
14 publications · 679 citations
12
h-index

1–5 of 1.3K

Institutions

391

1–8 of 391

Venues

IEEE Transactions on Microwave Theory and Techniques
63 publications · 3K citations
30
h-index
IEEE Transactions on Instrumentation and Measurement
22 publications · 837 citations
18
h-index
IEEE Transactions on Electron Devices
16 publications · 735 citations
13
h-index
Applied Physics Letters
11 publications · 378 citations
11
h-index
Electronics Letters
10 publications · 250 citations
10
h-index

1–5