Concepedia

Author

Jan Verspecht

Agilent Technologies (United States)ORCID

Also Known As

J. Verspecht, Jan Verspecht, Verspecht, J., Verspecht, Jan

120

Publications

2.7K

Citations

28

H-Index

81

Concepts

All Affiliations

Agilent Technologies (United States)KU LeuvenVrije Universiteit BrusselHewlett-Packard (United States)Université de Limoges
JV

About

Jan Verspecht is an author at Agilent Technologies (United States) specializing in engineering, signal processing, and electrical engineering.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

26

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2.1K

2

Education

16

21

985

3

Applied Physics

3

3

51

4

Biostatistics

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2

181

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Social Sciences

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67

Jan Verspecht

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55

Publications

2.3K

Citations

27

H-Index

YearCitations

Broad-band poly-harmonic distortion (PHD) behavioral models from fast automated simulations and large-signal vectorial network measurements

David E. Root, Jan Verspecht, D. Sharrit,

IEEE Transactions on Microwave Theory and Techniques

2005

229

Accurate on wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device

Jan Verspecht, P. Debie, André Barel,

2002

151

Large-signal network analysis

Jan Verspecht

IEEE Microwave Magazine

2005

131

Calibrated vectorial nonlinear-network analyzers

Tom Van Den Broeck, Jan Verspecht

2002

120

Calibration of a Measurement System for High Frequency Nonlinear Devices

Jan Verspecht

1995

93

Individual characterization of broadband sampling oscilloscopes with a nose-to-nose calibration procedure

Jan Verspecht, K. Rush

IEEE Transactions on Instrumentation and Measurement

1994

88

Linearization of large-signal scattering functions

Jan Verspecht, Dylan F. Williams, Dominique Schreurs,

IEEE Transactions on Microwave Theory and Techniques

2005

86

New Trends for the Nonlinear Measurement and Modeling of High-Power RF Transistors and Amplifiers With Memory Effects

Patrick Roblin, David E. Root, Jan Verspecht,

IEEE Transactions on Microwave Theory and Techniques

2012

84

Straightforward and accurate nonlinear device model parameter-estimation method based on vectorial large-signal measurements

Dominique Schreurs, Jan Verspecht, S. Vandenberghe,

IEEE Transactions on Microwave Theory and Techniques

2002

79

Individual characterization of broadband sampling oscilloscopes with a 'nose-to-nose' calibration procedure

Jan Verspecht, K. Rush

2002

75

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