2002 · 14 citations · 12 references
Natural SciencesComputer EngineeringFault-tolerant ComputingFault-tolerant SystemsStatisticsDefect ModelingDefectsDefects In Electronic MaterialsReliability ModelingYield AnalysisYield PredictionFault CoverageFault Coverage AnalysisFault Coverage ModelingFault PredictionHardware Fault ModelsProbabilistic Fault ModelingYield Reliability
The influence of non-random defect distributions and of non-modelled faults on the behavior of the cumulative chip fallout as a function of the cumulative fault coverage is discussed. The theory is applied to published yield data and a novel explanation of the deviation of these data from the classical Williams-Brown theory is presented.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
12
Defect Level as a Function of Fault Coverage
Williams, Brown · IEEE Transactions on Computers · 1981 · 348 citations
Engineering, Computer Engineering, Electrical Engineering +17