Yield Analysis
Yield Analysis is a land-use planning technique in subdivision planning that estimates the maximum number and configuration of developable lots or dwelling units on a given tract of land by systematically applying zoning regulations, physical and environmental constraints, and infrastructure and design standards.
574
Publications
22.7K
Citations
1.4K
Authors
520
Institutions
Publications per year
2017–2026
61
Parents
574
Integrated circuit yield statistics
C.H. Stapper, F.M. Armstrong, K. Saji · Proceedings of the IEEE · 1983 · 405 citations
Engineering, Electrical Engineering, Manufacturing Engineering +15
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IBM (United States)
Armonk, United States
17 h-index
47 publications
2.5K citations
Carnegie Mellon University
Pittsburgh, United States
13 h-index
36 publications
1.5K citations

National Yang Ming Chiao Tung University
Hsinchu, Taiwan
9 h-index
16 publications
281 citations
Texas A&M University
College Station, United States
8 h-index
13 publications
432 citations
Mentor Technologies
Tulsa, United States
8 h-index
26 publications
874 citations
National Tsing Hua University
Hsinchu, Taiwan
8 h-index
18 publications
1.4K citations
National Taiwan University of Science and Technology
Taipei, Taiwan
6 h-index
6 publications
146 citations
Purdue University West Lafayette
West Lafayette, United States
6 h-index
11 publications
723 citations
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36 publications · 1.5K citations
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16 publications · 672 citations
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10 publications · 632 citations
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9 publications · 981 citations
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