Lot Yield Calculation
Lot Yield Calculation is a metric in semiconductor manufacturing that quantifies the proportion of functional integrated circuits produced relative to the total number of circuits fabricated within a single production lot.
5
Publications
144
Citations
13
Authors
6
Institutions
Publications per year
2017–2026
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Parents
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1–5 of 5
13
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Feng Chia University
Taichung, Taiwan
2 h-index
2 publications
70 citations
National Chin-Yi University of Technology
Taichung, Taiwan
2 h-index
2 publications
35 citations

Tel Aviv University
Tel Aviv, Israel
1 h-index
1 publications
41 citations
National Tsing Hua University
Hsinchu, Taiwan
1 h-index
2 publications
24 citations

R.O.C Military Academy
Kaohsiung City, Taiwan
1 h-index
1 publications
23 citations

University of Waterloo
Waterloo, Canada
1 h-index
1 publications
41 citations
1–6 of 6
1 publications · 41 citations
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1 publications · 23 citations
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OR · 1 publications · 12 citations
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FPJ · 1 publications · 21 citations
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1 publications · 47 citations
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