C.H. Stapper

Integrated circuit yield statistics

C.H. Stapper, F.M. Armstrong, K. Saji · Proceedings of the IEEE · 1983 · 405 citations

Engineering, Electrical Engineering, Manufacturing Engineering +15

Modeling of Integrated Circuit Defect Sensitivities

C.H. Stapper · IBM Journal of Research and Development · 1983 · 282 citations

Engineering, Computer Engineering, Electrical Engineering +11

Yield Model for Productivity Optimization of VLSI Memory Chips with Redundancy and Partially Good Product

C.H. Stapper, A. N. McLaren, M. Dreckmann · IBM Journal of Research and Development · 1980 · 243 citations

Engineering, Computer Engineering, Electrical Engineering +17

Modeling of defects in integrated circuit photolithographic patterns

C.H. Stapper · IBM Journal of Research and Development · 1984 · 229 citations

Engineering, Electrical Engineering, Circuit Theory +16

Defect density distribution for LSI yield calculations

C.H. Stapper · IEEE Transactions on Electron Devices · 1973 · 182 citations

Engineering, Materials Science, Electronic Materials +11