Concepedia

Yield Reliability

Yield Reliability is an academic construct that refers to the consistency and dependability of a system, process, or model in producing stable output performance across varying conditions or over time within the domain of yield stability research.

31

Publications

1.5K

Citations

73

Authors

37

Institutions

Publications per year

2017–2026

2

Parents

Publications

31

Integrated circuit yield statistics

C.H. Stapper, F.M. Armstrong, K. Saji · Proceedings of the IEEE · 1983 · 405 citations

, , +15

Modeling the critical area in yield forecasts

A.V. Ferris-Prabhu · IEEE Journal of Solid-State Circuits · 1985 · 137 citations

, , +16

Shakedown limits for a general yield condition: implementation and application for a Von Mises yield condition

A.R.S. Ponter, Markus Engelhardt · European Journal of Mechanics - A/Solids · 2000 · 132 citations

, , +6

An overview of manufacturing yield and reliability modeling for semiconductor products

Way Kuo, Taeho Kim · Proceedings of the IEEE · 1999 · 127 citations

, , +15

Relation between yield and reliability of integrated circuits: experimental results and application to continuous early failure rate reduction programs

F.G. Kuper, J. van der Pol, E.R. Ooms et al. · 1996 · 62 citations

, , +11

1–5 of 31

Authors

73

  1. FK
    F.G. Kuper

    Philips (Netherlands), Netherlands

    4 publications · 151 citations

    4

    h-index

  2. EO
    E.R. Ooms

    Philips (Netherlands), Netherlands

    4 publications · 151 citations

    4

    h-index

  3. AS
    A.D. Singh

    Auburn University, United States

    3 publications · 77 citations

    3

    h-index

  4. JV
    J.A. van der Pol

    Philips (Netherlands), Netherlands

    3 publications · 89 citations

    3

    h-index

  5. TB
    T.S. Barnett

    Auburn University, United States

    3 publications · 77 citations

    3

    h-index

1–5 of 73

Institutions

37

  1. IBM (United States)

    Armonk, United States

    5 h-index

    13 publications

    1.5K citations

  2. Philips (Netherlands)

    Amsterdam, The Netherlands

    4 h-index

    14 publications

    651 citations

  3. Auburn University

    Auburn, United States

    3 h-index

    5 publications

    136 citations

  4. Philips (United States)

    Andover, United States

    2 h-index

    2 publications

    45 citations

  5. NXP (Netherlands)

    Eindhoven, The Netherlands

    2 h-index

    4 publications

    148 citations

  6. Tufts University

    Medford, United States

    2 h-index

    6 publications

    100 citations

  7. Universidade Federal do Ceará

    Fortaleza, Brazil

    2 h-index

    2 publications

    53 citations

  8. Korea Telecom (South Korea)

    Seongnam-si, South Korea

    1 h-index

    1 publications

    127 citations

1–8 of 37

Venues

  1. Microelectronics Reliability

    3 publications · 75 citations

    3

    h-index

  2. Proceedings of the IEEE

    3 publications · 549 citations

    3

    h-index

  3. Water

    2 publications · 34 citations

    2

    h-index

  4. Hydrological Sciences Journal

    2 publications · 48 citations

    2

    h-index

  5. 1

    h-index

1–5